DocumentCode :
1730106
Title :
Establishing the critical fracture properties of the die backside-to-molding compound interface
Author :
Schlottig, G. ; Pape, H. ; Wunderle, B. ; Ernst, L.J.
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
fYear :
2011
Firstpage :
1090
Lastpage :
1096
Abstract :
This paper presents essential improvements to determining interfacial fracture properties of the silicon die-to-molding compound interface. The improvements affect specimen fabrication in two different molding technologies and experimental methods using the mixed mode chisel (MMC) setup. We show how to overcome pre-test fracture of the delamination specimens, how to extend the previously aimed fracture mode mix range, how to reduce the number of experiments necessary and extrapolation methods in order to apply the interface data in failure models.
Keywords :
delamination; electronics packaging; extrapolation; failure analysis; fracture; moulding; critical fracture property; delamination specimens; die backside-to-molding compound interface; electronic packages; extrapolation methods; failure models; mixed mode chisel setup; pretest fracture; silicon die-to-molding compound interface; Compounds; Delamination; Fabrication; Geometry; Materials; Stress; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898646
Filename :
5898646
Link To Document :
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