• DocumentCode
    1730106
  • Title

    Establishing the critical fracture properties of the die backside-to-molding compound interface

  • Author

    Schlottig, G. ; Pape, H. ; Wunderle, B. ; Ernst, L.J.

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • Firstpage
    1090
  • Lastpage
    1096
  • Abstract
    This paper presents essential improvements to determining interfacial fracture properties of the silicon die-to-molding compound interface. The improvements affect specimen fabrication in two different molding technologies and experimental methods using the mixed mode chisel (MMC) setup. We show how to overcome pre-test fracture of the delamination specimens, how to extend the previously aimed fracture mode mix range, how to reduce the number of experiments necessary and extrapolation methods in order to apply the interface data in failure models.
  • Keywords
    delamination; electronics packaging; extrapolation; failure analysis; fracture; moulding; critical fracture property; delamination specimens; die backside-to-molding compound interface; electronic packages; extrapolation methods; failure models; mixed mode chisel setup; pretest fracture; silicon die-to-molding compound interface; Compounds; Delamination; Fabrication; Geometry; Materials; Stress; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898646
  • Filename
    5898646