DocumentCode
1730106
Title
Establishing the critical fracture properties of the die backside-to-molding compound interface
Author
Schlottig, G. ; Pape, H. ; Wunderle, B. ; Ernst, L.J.
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
fYear
2011
Firstpage
1090
Lastpage
1096
Abstract
This paper presents essential improvements to determining interfacial fracture properties of the silicon die-to-molding compound interface. The improvements affect specimen fabrication in two different molding technologies and experimental methods using the mixed mode chisel (MMC) setup. We show how to overcome pre-test fracture of the delamination specimens, how to extend the previously aimed fracture mode mix range, how to reduce the number of experiments necessary and extrapolation methods in order to apply the interface data in failure models.
Keywords
delamination; electronics packaging; extrapolation; failure analysis; fracture; moulding; critical fracture property; delamination specimens; die backside-to-molding compound interface; electronic packages; extrapolation methods; failure models; mixed mode chisel setup; pretest fracture; silicon die-to-molding compound interface; Compounds; Delamination; Fabrication; Geometry; Materials; Stress; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898646
Filename
5898646
Link To Document