DocumentCode
1730165
Title
A study on the 3D-TSV interconnection using wafer-level non-conductive adhesives (NCAs)
Author
Choi, Yongwon ; Shin, Jiwon ; Paik, Kyung-Wook
Author_Institution
Dept. of Mater. Sci. & Eng., KAIST, Daejeon, South Korea
fYear
2011
Firstpage
1126
Lastpage
1129
Abstract
In this study, the chip to chip eutectic bonding method of TSV stacking using various NCAs are investigated as an alternative chip to chip/wafer interconnection method for 3D-TSV application. The non-conductive polymer adhesives so called, TSV Conductive Adhesives (TCAs), are applied on the chip/wafer before bonding so that it acts like both adhesive and underfill. No additional underfill process is needed. The effects of material properties of TCAs such as curing behavior, and viscosity on the joint formation for 3D-TSV chip interconnection are investigated.
Keywords
adhesive bonding; adhesives; three-dimensional integrated circuits; 3D-TSV chip interconnection; TSV conductive adhesives; TSV stacking; chip/wafer interconnection method; eutectic bonding; nonconductive polymer adhesives; wafer-level nonconductive adhesives; Bonding; Curing; Joints; Stacking; Temperature measurement; Through-silicon vias; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898651
Filename
5898651
Link To Document