• DocumentCode
    1730165
  • Title

    A study on the 3D-TSV interconnection using wafer-level non-conductive adhesives (NCAs)

  • Author

    Choi, Yongwon ; Shin, Jiwon ; Paik, Kyung-Wook

  • Author_Institution
    Dept. of Mater. Sci. & Eng., KAIST, Daejeon, South Korea
  • fYear
    2011
  • Firstpage
    1126
  • Lastpage
    1129
  • Abstract
    In this study, the chip to chip eutectic bonding method of TSV stacking using various NCAs are investigated as an alternative chip to chip/wafer interconnection method for 3D-TSV application. The non-conductive polymer adhesives so called, TSV Conductive Adhesives (TCAs), are applied on the chip/wafer before bonding so that it acts like both adhesive and underfill. No additional underfill process is needed. The effects of material properties of TCAs such as curing behavior, and viscosity on the joint formation for 3D-TSV chip interconnection are investigated.
  • Keywords
    adhesive bonding; adhesives; three-dimensional integrated circuits; 3D-TSV chip interconnection; TSV conductive adhesives; TSV stacking; chip/wafer interconnection method; eutectic bonding; nonconductive polymer adhesives; wafer-level nonconductive adhesives; Bonding; Curing; Joints; Stacking; Temperature measurement; Through-silicon vias; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898651
  • Filename
    5898651