DocumentCode :
1730387
Title :
High-speed PNP PIN phototransistors in a 0.18 μm CMOS process
Author :
Kostov, Plamen ; Gaberl, Wolfgang ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
fYear :
2011
Firstpage :
187
Lastpage :
190
Abstract :
In this work we present three speed optimized types of phototransistors built in a standard 180 nm CMOS technology without process modifications. An OPTO ASIC wafer consisting of a p+ substrate with a low doped p+ epitaxial layer on top of it is used for the implementation. The phototransistors were produced in 40×40 μm2 and 100×100 μm2 sizes. A gain in responsivity of more than 13 and bandwidths up to 50.7 MHz are achieved. As emitter followers, these phototransistors open the opportunity for application where high-speed photosensitive devices with inherent gain are needed. Possible applications are high speed opto-couplers, optical sensors, image sensors, etc.
Keywords :
CMOS integrated circuits; amplifiers; application specific integrated circuits; phototransistors; OPTO ASIC wafer; emitter followers; high-speed PNP pin phototransistors; image sensors; low doped p- epitaxial layer; optical sensors; optocouplers; p+ substrate; photosensitive devices; size 0.18 mum; standard CMOS technology; Bandwidth; CMOS integrated circuits; CMOS process; Capacitance; Optical variables measurement; Phototransistors; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European
Conference_Location :
Helsinki
ISSN :
1930-8876
Print_ISBN :
978-1-4577-0707-0
Electronic_ISBN :
1930-8876
Type :
conf
DOI :
10.1109/ESSDERC.2011.6044203
Filename :
6044203
Link To Document :
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