DocumentCode :
1730404
Title :
A methodology for assessing high intensity RF effects in aircraft
Author :
Zacharias, R.A. ; Avalle, C.A. ; Kunz, K.S. ; Molau, N.E. ; Pennock, S.T. ; Poggio, A.J. ; Sharpe, R.M.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
fYear :
1993
Firstpage :
451
Lastpage :
456
Abstract :
Optical components have an inherent immunity to the electromagnetic interference (EMI) associated with High Intensity Radiated Fields (HIRF). The optical technology embodied in Fly-by-Light (FBL) might therefore minimize the effects of HIRF on digitally controlled systems while providing lifetime immunity to signal EMI. This is one of the primary motivations for developing FBL systems for aircraft. FBL has the potential to greatly simplify EMI certification by enabling technically acceptable laboratory tests of subsystems, as opposed to expensive full airplane tests. The authors describe a methodology for assessing EMI effects on FBL aircraft that reduces or potentially eliminates the need for full airplane tests. This methodology is based on comparing the applied EMI stress-the level of interference signal that arrives at a unit under test-versus the EMI strength of the unit-the interference level it can withstand without upset. This approach allows one to use computer models and/or low power coupling measurements and similarity (to other previously tested aircraft) to determine the stress applied to installed subsystems, and to use benchtop cable injection tests and/or mode stirred chamber radiated tests to determine the strength of the subsystem
Keywords :
aerospace computing; aerospace testing; aircraft instrumentation; digital simulation; radiofrequency interference; EMI strength; EMI stress; Fly-by-Light; High Intensity Radiated Fields; aircraft; benchtop cable injection tests; coherence length; computer models; electromagnetic interference; high intensity RF effects; low power coupling measurements; mode stirred chambers; separability; Aircraft; Airplanes; Certification; Control systems; Digital control; Electromagnetic interference; Optical control; Optical devices; Radio frequency; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 1993. 12th DASC., AIAA/IEEE
Conference_Location :
Fort Worth, TX
Print_ISBN :
0-7803-1343-7
Type :
conf
DOI :
10.1109/DASC.1993.283508
Filename :
283508
Link To Document :
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