Title :
Nano and micro materials in a Pb-free world
Author :
Das, Rabindra N. ; Lauffer, John M. ; Knadle, Kevin ; Vincent, Michael ; Poliks, Mark D. ; Markovich, Voya R.
Author_Institution :
Endicott Interconnect Technol., Inc., Endicott, NY, USA
Abstract :
This paper examines the use of nano and micro materials in the area of “Pb-free” technology. A variety of Pb-free materials for advanced organic packaging have been developed. These include capacitors as embedded passives, highly conducting nano-micro media for Z-interconnects, lead free assembly paste, and Z-interconnects suitable for Pb-free assembly. The electrical properties of capacitors fabricated from BaTiO3-epoxy nanocomposites showed a stable capacitance over a temperature range from 20°C to 120°C. Low resistivity paste, with volume resistivity in the range of 10-4 ohm-cm to 10-5 ohm-cm depending on composition, particle size, and loading can be used as conductive joints for high frequency and high density interconnect applications. A variety of metals including Cu, Ag, LMP (low melting point) and LMP-coated Cu fillers have been used to make lead free electrically conducting adhesive technology as an alternative to solders. The mechanical strength of the various Pb-free conducting pastes was characterized by the measurement of tensile strength. Most of the conducting pastes exhibited no fail even up to 1500 PSI. Reliability of the Pb-free structures was ascertained by IR-reflow, thermal cycling, PCT (Pressure Cooker Test) and solder shock. All capacitors experienced less than 5% change after 3X, Pb-free IR reflow and 1000 cycles of thermal cycling (ATC, DTC). Altogether, this is a new direction in the development of Pb-free Packages and more specifically in the development of substrates with Z-interconnects suitable for Pb-free assembly.
Keywords :
assembling; capacitance; capacitors; copper alloys; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; melting point; nanocomposites; nanostructured materials; particle size; silver alloys; solders; tensile strength; Ag; BaTiO3; Cu; IR-reflow; LMP-coated Cu filler; Pb-free assembly; Pb-free conducting paste; Pb-free material; Pb-free package; Pb-free structure; Pb-free technology; Pb-free world; Z-interconnects; capacitance; capacitor; conductive joint; electrical property; embedded passives; epoxy nanocomposite; high density interconnect application; high frequency interconnect application; lead free assembly paste; lead free electrically conducting adhesive technology; loading; low melting point; low resistivity paste; mechanical strength; micromaterial; nanomaterial; nanomicro media; organic packaging; particle size; pressure cooker test; reliability; solder shock; temperature 20 C to 120 C; tensile strength measurement; thermal cycling; volume resistivity; Assembly; Capacitance; Capacitors; Copper; Lead; Substrates;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2011.5898667