Title :
Drop reliability of glass panel for LCD
Author :
Chung, Soon-Wan ; Jeong, Jae-Woo ; Oh, Seunghee ; Moon, Young-Jun ; Baek, In-Youl ; Hong, Dong-Sool
Author_Institution :
Samsung Electron. Co., Ltd., Suwon, South Korea
Abstract :
In this paper, drop reliability of TFT-LCD panel and module used in digital cameras is investigated since LCD glass failure is one of the most critical quality issues in handheld products. First, three point bending test is performed to evaluate LCD glass quality. The critical force is measured in the bending test even though the data scatter is not small. Second, three point bending simulation is performed by using the critical force obtained from the bending test. For the assessment of glass panel crack, EWK (ESI-Wilkins-Kamoulakos) damage and rupture model is utilized in the bending simulation. Finally, drop impact test and simulation are carried out to verify the drop reliability assessment process for LCD glass panel.
Keywords :
bending; cameras; glass; liquid crystal displays; semiconductor device reliability; thin film transistors; ESI-Wilkins-Kamoulakos; EWK; LCD glass failure; LCD glass quality; TFT-LCD glass panel drop reliability; bending test; digital cameras; glass panel crack; handheld products; Computational modeling; Glass; Load modeling; Loading; Predictive models; Stress;
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2011.5898671