• DocumentCode
    1730665
  • Title

    Drop reliability of glass panel for LCD

  • Author

    Chung, Soon-Wan ; Jeong, Jae-Woo ; Oh, Seunghee ; Moon, Young-Jun ; Baek, In-Youl ; Hong, Dong-Sool

  • Author_Institution
    Samsung Electron. Co., Ltd., Suwon, South Korea
  • fYear
    2011
  • Firstpage
    1250
  • Lastpage
    1254
  • Abstract
    In this paper, drop reliability of TFT-LCD panel and module used in digital cameras is investigated since LCD glass failure is one of the most critical quality issues in handheld products. First, three point bending test is performed to evaluate LCD glass quality. The critical force is measured in the bending test even though the data scatter is not small. Second, three point bending simulation is performed by using the critical force obtained from the bending test. For the assessment of glass panel crack, EWK (ESI-Wilkins-Kamoulakos) damage and rupture model is utilized in the bending simulation. Finally, drop impact test and simulation are carried out to verify the drop reliability assessment process for LCD glass panel.
  • Keywords
    bending; cameras; glass; liquid crystal displays; semiconductor device reliability; thin film transistors; ESI-Wilkins-Kamoulakos; EWK; LCD glass failure; LCD glass quality; TFT-LCD glass panel drop reliability; bending test; digital cameras; glass panel crack; handheld products; Computational modeling; Glass; Load modeling; Loading; Predictive models; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898671
  • Filename
    5898671