Title :
Fine-Grain Multiple-Valued Reconfigurable VLSI Using Universal-Literal-Based Cells
Author :
Okada, Nobuaki ; Kameyama, Michitaka
Author_Institution :
Grad. Sch. of Inf. Sci., Tohoku Univ., Sendai
Abstract :
A fine-grain reconfigurable VLSI for various applications including arithmetic operations is developed. In the fine-grain architecture, it is important to define a cell function which leads to high utilization of a logic block and reduction of a switch block. From the point of view, a universal-literal-based multiple-valued cell suitable for bit- serial reconfigurable computation is proposed. One of an arbitrary 2-variable binary logic operation, an addition and a subtraction can be executed by one cell. Also, an ntimesn-bit multiplication can be executed by 4n cells. A series-gating differential-pair circuit is effectively employed for implementing a full-adder circuit of Sum and a universal literal circuit. Therefore, a very simple cell can be constructed using the circuit technology. Moreover, interconnection complexity can be reduced by utilizing multiple- valued signaling, where superposition of serial data bits and a start signal which indicates a head of one-word is introduced.
Keywords :
VLSI; adders; circuit complexity; digital arithmetic; integrated circuit interconnections; multivalued logic circuits; arithmetic operation; binary logic operation; bit-serial reconfigurable computation; fine-grain multiple-valued reconfigurable VLSI; full-adder circuit; interconnection complexity; series-gating differential-pair circuit; universal-literal-based cells; Arithmetic; Computer architecture; Hardware; Integrated circuit interconnections; Logic circuits; Multivalued logic; Reconfigurable logic; Signal processing; Switches; Very large scale integration; Bit-serial architecture; Differential-Pair circuit; Field-programmable VLSI; Multiple-valued source-coupled logic;
Conference_Titel :
Multiple Valued Logic, 2008. ISMVL 2008. 38th International Symposium on
Conference_Location :
Dallas, TX
Print_ISBN :
978-0-7695-3155-7
DOI :
10.1109/ISMVL.2008.46