DocumentCode
1731347
Title
Fractal processes and Weibull statistics
Author
Dissdo, L.A.
Author_Institution
Dept. of Phys., King´s Coll. London
fYear
1989
Firstpage
538
Lastpage
532
Abstract
The use of Weibull statistics to study dielectric failure is discussed. Fractal processes involved in breakdown are considered, with particular emphasis on the stochastic progress of a filamentary discharge or conducting path. Here fluctuations in the length at a given time will lead to a Weibull statistic in time. Electrical trees are used to illustrate some of the points discussed
Keywords
electric breakdown of solids; fractals; stochastic processes; Weibull statistics; conducting path; dielectric failure; electric breakdown; electrical trees; filamentary discharge; fractal processes; stochastic progress; Conductors; Electric breakdown; Fractals; Gaussian distribution; Insulation; Probability; Stability criteria; Statistical distributions; Statistics; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
Conference_Location
Trondheim
Type
conf
DOI
10.1109/ICSD.1989.69269
Filename
69269
Link To Document