Title :
Fractal processes and Weibull statistics
Author_Institution :
Dept. of Phys., King´s Coll. London
Abstract :
The use of Weibull statistics to study dielectric failure is discussed. Fractal processes involved in breakdown are considered, with particular emphasis on the stochastic progress of a filamentary discharge or conducting path. Here fluctuations in the length at a given time will lead to a Weibull statistic in time. Electrical trees are used to illustrate some of the points discussed
Keywords :
electric breakdown of solids; fractals; stochastic processes; Weibull statistics; conducting path; dielectric failure; electric breakdown; electrical trees; filamentary discharge; fractal processes; stochastic progress; Conductors; Electric breakdown; Fractals; Gaussian distribution; Insulation; Probability; Stability criteria; Statistical distributions; Statistics; Testing;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
Conference_Location :
Trondheim
DOI :
10.1109/ICSD.1989.69269
