DocumentCode
1731464
Title
Fracture-mechanical interface characterisation for thermo-mechanical co-design — An effcient and comprehensive method for critical mixed-mode data extraction
Author
Wunderle, B. ; Schulz, M. ; Keller, J. ; Schlottig, G. ; Maus, I. ; May, D. ; Hölck, O. ; Pape, H. ; Michel, B.
Author_Institution
Chemnitz Univ. of Technol., Chemnitz, Germany
fYear
2011
Firstpage
1459
Lastpage
1467
Abstract
This paper presents a comprehensive method for obtaining urgently required critical interface delamination data of material pairings used in electronic packaging. The objective is to thereby enable rapid, inexpensive and accurate lifetime prediction for that failure mode. A new testing method is presented which allows large mode-angle range and enhanced throughput testing under multiple loading conditions, the coverage of which is usually a rather lengthy and resource-demanding procedure. The approach is specimen-centred in the sense that the accent is put on test-specimens which are easily manufacturable industrially, rather than having to adapt them to a special testing machine. The concept is also scalable, i.e. it has potential to work also for smaller samples cut from real devices. We show the first version of a newly developed test-stand and discuss first results for copper-molding compound interfaces and interpret them using simulations.
Keywords
delamination; fracture; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; moulding; thermal management (packaging); thermomechanical treatment; copper molding compound interface; critical interface delamination data; critical mixed-mode data extraction; electronic packaging; failure mode; fracture-mechanical interface characterisation; lifetime prediction; loading condition; material pairings; thermomechanical codesign; throughput testing; Copper; Delamination; Extrapolation; Load modeling; Loading; Materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898703
Filename
5898703
Link To Document