• DocumentCode
    1731464
  • Title

    Fracture-mechanical interface characterisation for thermo-mechanical co-design — An effcient and comprehensive method for critical mixed-mode data extraction

  • Author

    Wunderle, B. ; Schulz, M. ; Keller, J. ; Schlottig, G. ; Maus, I. ; May, D. ; Hölck, O. ; Pape, H. ; Michel, B.

  • Author_Institution
    Chemnitz Univ. of Technol., Chemnitz, Germany
  • fYear
    2011
  • Firstpage
    1459
  • Lastpage
    1467
  • Abstract
    This paper presents a comprehensive method for obtaining urgently required critical interface delamination data of material pairings used in electronic packaging. The objective is to thereby enable rapid, inexpensive and accurate lifetime prediction for that failure mode. A new testing method is presented which allows large mode-angle range and enhanced throughput testing under multiple loading conditions, the coverage of which is usually a rather lengthy and resource-demanding procedure. The approach is specimen-centred in the sense that the accent is put on test-specimens which are easily manufacturable industrially, rather than having to adapt them to a special testing machine. The concept is also scalable, i.e. it has potential to work also for smaller samples cut from real devices. We show the first version of a newly developed test-stand and discuss first results for copper-molding compound interfaces and interpret them using simulations.
  • Keywords
    delamination; fracture; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; moulding; thermal management (packaging); thermomechanical treatment; copper molding compound interface; critical interface delamination data; critical mixed-mode data extraction; electronic packaging; failure mode; fracture-mechanical interface characterisation; lifetime prediction; loading condition; material pairings; thermomechanical codesign; throughput testing; Copper; Delamination; Extrapolation; Load modeling; Loading; Materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898703
  • Filename
    5898703