DocumentCode :
1731610
Title :
Recent progress on the NRC 88Sr+ single-ion optical frequency standard
Author :
Dubé, P. ; Madej, A.A. ; Bernard, J.E. ; Humphrey, G. ; Vainio, M. ; Jiang, J. ; Jones, D.J.
Author_Institution :
NRC, Inst. for Nat. Meas. Stand., Ottawa, ON, Canada
fYear :
2010
Firstpage :
65
Lastpage :
70
Abstract :
We report our recent progress made with the NRC 88Sr+ single-ion optical frequency standard. The long-term operation of the standard was improved by actively stabilizing the cooling, repump and clearout laser sources, and by using a femtosecond fiber laser frequency comb to link the probe laser frequency to the microwave time standards. With the femtosecond fiber comb, we have demonstrated continuous operation for a period of eight days and continuous measurement of the probe laser source for three days. Micromotion shifts have been the dominant source of uncertainty in our rf Paul trap because laser beam access is only possible along one axis in the current design. With the aim of reducing to a minimum these shifts, we have constructed an endcap trap designed for minimization of micromotion along three orthogonal axes. We report on the successful trapping of single ions with this endcap trap. Since electrode contamination during trap loading can also induce micromotion shifts as a result of evolving patch potentials, we have increased the trap loading efficiency with photo-ionization.
Keywords :
atom-photon collisions; high-speed optical techniques; laser cooling; photoionisation; strontium; trapped ions; 88Sr+; NRC 88Sr+ single-ion optical frequency standard; cooling; electrode contamination; femtosecond fiber laser frequency comb; laser beam; laser sources; micromotion shifts; microwave time standards; photoionization; probe laser frequency; rf Paul trap; single ion trapping; trap loading efficiency; Cavity resonators; Frequency measurement; Laser stability; Laser transitions; Masers; Measurement by laser beam; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2010 IEEE International
Conference_Location :
Newport Beach, CA
ISSN :
1075-6787
Print_ISBN :
978-1-4244-6399-2
Type :
conf
DOI :
10.1109/FREQ.2010.5556371
Filename :
5556371
Link To Document :
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