Abstract :
Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
Conference_Location :
Como, Italy
Print_ISBN :
0-7803-8248-X
DOI :
10.1109/IMTC.2004.1350980
