• DocumentCode
    1731939
  • Title

    SiC devices offer improved reliability for T&D applications

  • Author

    Bassett, Roger ; Ballad, John

  • Author_Institution
    AREVA T&D Technology Centre - United Kingdom
  • fYear
    2005
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The purpose of this paper is to identify and describe the key enabling roles that SiC power semiconductor devices will play in future envisaged electricity networks. Prospective SiC devices have higher voltage rating, are faster switching and can operate at higher temperature than their Si counterparts. Hence power electronic (PE) equipment using SiC devices will have, not only much lower dissipation, but also a lower component count and thus be more compact and reliable.
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Electricity Distribution, 2005. CIRED 2005. 18th International Conference and Exhibition on
  • Conference_Location
    Turin, Italy
  • Type

    conf

  • Filename
    5428172