Title :
Performance analysis in chaotic-iteration-based ADCs
Author :
Shan, Xiuming ; Liu, Yulong ; Lin, Hao ; Ren, Yong
fDate :
6/24/1905 12:00:00 AM
Abstract :
Chaos is an inherent property in the cyclic A/D conversion process. The principle has been extended to construct ´general cyclic ADCs´ based on chaotic iterations. The new attributes of the converters are also discussed. The analytic expressions of random error and system error in general cyclic ADCs are established and verified by simulations. With the same level of additive white noise, the optimal maps have been derived.
Keywords :
analogue-digital conversion; chaos; error analysis; additive white noise; chaotic iterations; chaotic-iteration-based ADCs; cyclic A/D conversion process; error model; general cyclic ADCs; optimal maps; performance analysis; random error; system error; Additive white noise; Binary codes; Buildings; Chaos; Clocks; Computer errors; Detectors; Performance analysis; Postal services; Switches;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009860
