DocumentCode :
1732103
Title :
Effects of defects on armatures within helical flux-compression generators
Author :
Baird, J. ; Worsey, P.N. ; Schmidt, M.F.C.
Author_Institution :
Missouri Univ., Rolla, MO, USA
fYear :
2001
Firstpage :
226
Abstract :
Summary form only given, as follows. Tubes of aluminum and copper filled with C-4 high-explosive were tested during this study of the effects of explosive flaws and voids, their sizes and locations, and of the effects of armature machining tolerances on the expansion characteristics of armatures within helical flux-compression generators. Flaws and voids were introduced into the explosive fill of 6061-T6 aluminum armatures during assembly. The defects were located along the major axis of the fill, midway between the major axis and the explosive/armature interface, and at the interface. The resulting effects on armature expansion were recorded by intensified charge-coupled display (ICCD) photography and by flash X-ray. Outer and inner surface defects were introduced into OFHC copper and 6061-T6 aluminum armatures via machining. The resulting effects during armature expansion were recorded by framing camera and by ICCD.
Keywords :
CCD image sensors; X-ray detection; machining; photography; pulse generators; pulsed power supplies; voids (solid); 6061-T6 Al armatures; Al; AlMgSi; C-4 high-explosive; Cu; ICCD; OFHC Cu; armature expansion; armature machining tolerances; armatures; expansion characteristics; explosive fill; explosive flaws; explosive voids; explosive/armature interface; flash X-ray; flaws; framing camera; helical flux-compression generators; inner surface defects; intensified charge-coupled display photography; machining; major axis; outer surface defects; voids; Aluminum; Assembly; Cameras; Character generation; Copper; Displays; Explosives; Machining; Photography; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.960830
Filename :
960830
Link To Document :
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