DocumentCode :
1732174
Title :
Wafer-level glass-caps for advanced optical applications
Author :
Leib, Juergen ; Gyenge, Oliver ; Hansen, Ulli ; Maus, Simon ; Hauck, Karin ; Zoschke, Kai ; Toepper, Michael
Author_Institution :
MSG Lithoglas AG, Berlin, Germany
fYear :
2011
Firstpage :
1642
Lastpage :
1648
Abstract :
A novel process flow to manufacture miniaturized optical windows on wafer-level is presented. Those windows can be used for miniaturized optical products like high-brightness LEDs (HB-LED) and digital projection (DLP) as well as more complex optical data-communication, since integrated optical functions can be implemented with low tolerances. We explain the fabrication of cap-wafers having a shallow cavity with a depth of typically 10μm used in photo sensors and a unique manufacturing process for cap-wafers with a deep cavity of e.g. 300μm used in LED packaging. Those cap-wafers are used in wafer-level integration of advanced, miniaturized optical products. We discuss two options for wafer bonding i.e. bonding using adhesive as well as anodic bonding. As an example on product level a miniaturized photo sensor package, a pressure sensor package as well as a LED package is discussed.
Keywords :
integrated optics; light emitting diodes; photodetectors; wafer level packaging; LED packaging; advanced optical applications; anodic bonding; complex optical data communication; digital projection; integrated optical functions; miniaturized optical products; photosensors; pressure sensor package; process flow; wafer bonding; wafer level glass caps; wafer level integration; Bonding; Cavity resonators; Glass; Optical device fabrication; Optical imaging; Optical sensors; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898732
Filename :
5898732
Link To Document :
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