Title :
Test Instrumentation and Pattern Matching for Automatic Failure Identification
Author :
Travison, Dan ; Staneff, Geoff
Author_Institution :
Microsoft Corp., Redmond, WA
Abstract :
An increasing emphasis on test automation presents test teams with a growing set of results to review and investigate. The life time of a given failure typically spans multiple automation runs making the necessary due-diligence effort time consuming, labor intensive, error prone and often redundant. When faced with this condition within their teams, the authors addressed the problem from two approaches; pattern recognition and instrumentation. Pattern recognition sought to automate some of the manual processes of failure identification while instrumentation provided a detailed and consistent description of a failure. In practice, the problem divides into 3 domains; instrumentation, annotation, and recognition. Instrumentation forms the basis for the solution. Annotation provides the ability to refine a given pattern based on the investigation results. Recognition forms the basis for identification. The effectiveness of the solution in a production environment will be discussed. Best practices and lessons learned will be shared.
Keywords :
pattern matching; program testing; software reliability; system recovery; automatic failure identification; instrumentation; pattern matching; pattern recognition; test instrumentation; Automatic testing; Automation; Best practices; Instruments; Libraries; Pattern matching; Pattern recognition; Production; Software testing; Stress; Failure Analysis; Test Case Instrumentation;
Conference_Titel :
Software Testing, Verification, and Validation, 2008 1st International Conference on
Conference_Location :
Lillehammer
Print_ISBN :
978-0-7695-3127-4
DOI :
10.1109/ICST.2008.69