DocumentCode :
1732904
Title :
Nano resolution imaging technique with a near-field scanning microwave microscope
Author :
Yoo, Hyunjun ; Kim, Songhui ; Yang, Jongil ; Lee, Kiejin ; Friedman, Barry
Author_Institution :
Dept. of Phys., Sogang Univ., Seoul, South Korea
Volume :
1
fYear :
2004
Firstpage :
190
Abstract :
We demonstrated a near-field scanning microwave microscope (NSMM) with a nano spatial resolution using a hybrid tip. In order to understand the function of the probe, we fabricated the hybrid tip with a flat shaped shoulder and a reduced length of the tapered part using a conventional chemical etching technique. Two different NSMM images were observed for patterned Cr films on glass substrates and analyzed as a function of the apex and the cone angle of the tapered part. The hybrid tips were coupled to a high quality dielectric resonator at an operating frequency f = 4.46 GHz. By using the hybrid tip, we demonstrated an improved high contrast NSMM image of lambda phage DNA on a glass substrate.
Keywords :
DNA; dielectric resonators; image resolution; microwave imaging; microwave measurement; near-field scanning optical microscopy; 4.46 GHz; NSMM images; chemical etching technique; cone angle; dielectric resonator; glass substrates; hybrid tip; image contrast; lambda phage DNA; nanoresolution imaging; nanospatial resolution; near-field scanning microwave microscope; patterned Cr films; Chemicals; Dielectric substrates; Etching; Glass; Image resolution; Microscopy; Microwave imaging; Microwave theory and techniques; Probes; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8248-X
Type :
conf
DOI :
10.1109/IMTC.2004.1351025
Filename :
1351025
Link To Document :
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