DocumentCode :
173296
Title :
Considering variation and aging in a full chip design methodology at system level
Author :
Helms, Domenik ; Gruttner, Kim ; Eilers, Reef ; Metzdorf, Malte ; Hylla, Kai ; Poppen, F. ; Nebel, Wolfgang
Author_Institution :
OFFIS - Inst. for Inf. Technol., Oldenburg, Germany
fYear :
2014
fDate :
May 31 2014-June 1 2014
Firstpage :
1
Lastpage :
6
Abstract :
We present a new system-level design methodology enabling the consideration of process variations and degradation due to aging in early stages of the design process. By mapping an executable system specification to SoC processing, communication and memory components in combination with component wise timing and power characterization with a source-level back-annotation, we enable efficient full SoC power and temperature over time simulations. Based on the resulting temporal and spatial power and temperature distribution we use a high-level multi-physics simulation to assess the impact of degradation and aging. We evaluate our approach using an ARM7 based SoC design.
Keywords :
ageing; system-on-chip; temperature distribution; ARM7 based SoC design; aging; communication components; component wise timing; full chip design; high-level multiphysics simulation; memory components; power characterization; process variations; source-level back-annotation; spatial power; system-level design; temperature distribution; temporal power; Aging; Computational modeling; Degradation; System-on-chip; Threshold voltage; Timing; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System Level Synthesis Conference (ESLsyn), Proceedings of the 2014
Conference_Location :
San Francisco, CA
Print_ISBN :
979-10-92279-00-9
Type :
conf
DOI :
10.1109/ESLsyn.2014.6850386
Filename :
6850386
Link To Document :
بازگشت