Title :
Steering Committee and Subcommittees
Abstract :
Provides a listing of current committee members.
Keywords :
Application specific integrated circuits; Conferences; Finance; Gold; Graphics; Instruments; Logic testing; Probes; Sun;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
DOI :
10.1109/TEST.2008.4700533
