• DocumentCode
    1732964
  • Title

    Steering Committee and Subcommittees

  • fYear
    2008
  • Firstpage
    2
  • Lastpage
    3
  • Abstract
    Provides a listing of current committee members.
  • Keywords
    Application specific integrated circuits; Conferences; Finance; Gold; Graphics; Instruments; Logic testing; Probes; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700533
  • Filename
    4700533
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1732964