• DocumentCode
    1733046
  • Title

    International Test Conference 2008 Technical Program Committee

  • fYear
    2008
  • Firstpage
    9
  • Lastpage
    9
  • Abstract
    Provides a listing of current committee members.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700537
  • Filename
    4700537
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1733046