Title :
TTTC: Test Technology Technical Council
Abstract :
Provides a listing of current committee members and society officers.
Keywords :
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
DOI :
10.1109/TEST.2008.4700544
