Title :
Design of robust electronic circuits for yield optimization
Author :
Salzig, Christian ; Hauser, Matthias
Author_Institution :
Fraunhofer-Inst. fur Techno- und Wirtschaftmathematik, Kaiserslautern, Germany
Abstract :
With the trend from micro- to nanoelectronics the control of production deviations can not keep pace with the reduction of the absolute sizes of semiconductor devices. This results in an increased number of circuits beyond specification. The presented symbolic methods for reducing behavioral models with parameter variations assist designing and optimizing robust electronic circuits to increase the yield of produced circuits.
Keywords :
circuit optimisation; integrated circuit design; integrated circuit yield; nanoelectronics; microelectronics; nanoelectronics; parameter variations; production deviations; robust electronic circuit; symbolic method; yield optimization; Approximation methods; Integrated circuit modeling; Mathematical model; Monte Carlo methods; Numerical models; Reduced order systems; Sensitivity;
Conference_Titel :
Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD), 2010 XIth International Workshop on
Conference_Location :
Gammath
Print_ISBN :
978-1-4244-6816-4
DOI :
10.1109/SM2ACD.2010.5672315
