DocumentCode
1733309
Title
Design of robust electronic circuits for yield optimization
Author
Salzig, Christian ; Hauser, Matthias
Author_Institution
Fraunhofer-Inst. fur Techno- und Wirtschaftmathematik, Kaiserslautern, Germany
fYear
2010
Firstpage
1
Lastpage
5
Abstract
With the trend from micro- to nanoelectronics the control of production deviations can not keep pace with the reduction of the absolute sizes of semiconductor devices. This results in an increased number of circuits beyond specification. The presented symbolic methods for reducing behavioral models with parameter variations assist designing and optimizing robust electronic circuits to increase the yield of produced circuits.
Keywords
circuit optimisation; integrated circuit design; integrated circuit yield; nanoelectronics; microelectronics; nanoelectronics; parameter variations; production deviations; robust electronic circuit; symbolic method; yield optimization; Approximation methods; Integrated circuit modeling; Mathematical model; Monte Carlo methods; Numerical models; Reduced order systems; Sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD), 2010 XIth International Workshop on
Conference_Location
Gammath
Print_ISBN
978-1-4244-6816-4
Type
conf
DOI
10.1109/SM2ACD.2010.5672315
Filename
5672315
Link To Document