• DocumentCode
    1733333
  • Title

    Effect of chemical aging on warpage for encapsulated packages — Characterization and simulation

  • Author

    Chiu, Tz-Cheng ; Huang, Hong-Wei ; Lai, Yi-Shao

  • Author_Institution
    Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2011
  • Firstpage
    1894
  • Lastpage
    1900
  • Abstract
    The effect of curing process on the warpage of encapsulated electronic package is considered by using a coupled chemical-thermo-mechanical modeling methodology. A cure-dependent constitutive model that consists of a cure kinetics model, a curing and chemical aging induced shrinkage model and a degree of cure-dependent viscoelastic relaxation model was implemented in a numerical finite element model for warpage simulation. Effects of polymerization conversion and chemical aging on the warpage evolution of a bimaterial dummy package after molding and during the post-mold curing (PMC) process were investigated by using the proposed modeling methodology. Shadow Moiré warpage analyses were also performed to validate the numerical results. It was found from the warpage analyses that the chemical aging, while contributing little to the overall crosslinking during PMC, has a significant effect on package warpage. The coupled chemical-thermo-mechanical model can be applied for performing numerical optimization for packaging process and assembly reliability.
  • Keywords
    electronics packaging; finite element analysis; optimisation; reliability; Shadow Moire warpage analyses; assembly reliability; chemical aging induced shrinkage model; coupled chemical-thermomechanical modeling methodology; cure kinetics model; cure-dependent constitutive model; cure-dependent viscoelastic relaxation model; encapsulated electronic package; numerical finite element model; numerical optimization; polymerization conversion; post-mold curing process; Aging; Chemicals; Compounds; Electromagnetic compatibility; Numerical models; Polymers; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898774
  • Filename
    5898774