DocumentCode :
1733333
Title :
Effect of chemical aging on warpage for encapsulated packages — Characterization and simulation
Author :
Chiu, Tz-Cheng ; Huang, Hong-Wei ; Lai, Yi-Shao
Author_Institution :
Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2011
Firstpage :
1894
Lastpage :
1900
Abstract :
The effect of curing process on the warpage of encapsulated electronic package is considered by using a coupled chemical-thermo-mechanical modeling methodology. A cure-dependent constitutive model that consists of a cure kinetics model, a curing and chemical aging induced shrinkage model and a degree of cure-dependent viscoelastic relaxation model was implemented in a numerical finite element model for warpage simulation. Effects of polymerization conversion and chemical aging on the warpage evolution of a bimaterial dummy package after molding and during the post-mold curing (PMC) process were investigated by using the proposed modeling methodology. Shadow Moiré warpage analyses were also performed to validate the numerical results. It was found from the warpage analyses that the chemical aging, while contributing little to the overall crosslinking during PMC, has a significant effect on package warpage. The coupled chemical-thermo-mechanical model can be applied for performing numerical optimization for packaging process and assembly reliability.
Keywords :
electronics packaging; finite element analysis; optimisation; reliability; Shadow Moire warpage analyses; assembly reliability; chemical aging induced shrinkage model; coupled chemical-thermomechanical modeling methodology; cure kinetics model; cure-dependent constitutive model; cure-dependent viscoelastic relaxation model; encapsulated electronic package; numerical finite element model; numerical optimization; polymerization conversion; post-mold curing process; Aging; Chemicals; Compounds; Electromagnetic compatibility; Numerical models; Polymers; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898774
Filename :
5898774
Link To Document :
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