DocumentCode
1733333
Title
Effect of chemical aging on warpage for encapsulated packages — Characterization and simulation
Author
Chiu, Tz-Cheng ; Huang, Hong-Wei ; Lai, Yi-Shao
Author_Institution
Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
2011
Firstpage
1894
Lastpage
1900
Abstract
The effect of curing process on the warpage of encapsulated electronic package is considered by using a coupled chemical-thermo-mechanical modeling methodology. A cure-dependent constitutive model that consists of a cure kinetics model, a curing and chemical aging induced shrinkage model and a degree of cure-dependent viscoelastic relaxation model was implemented in a numerical finite element model for warpage simulation. Effects of polymerization conversion and chemical aging on the warpage evolution of a bimaterial dummy package after molding and during the post-mold curing (PMC) process were investigated by using the proposed modeling methodology. Shadow Moiré warpage analyses were also performed to validate the numerical results. It was found from the warpage analyses that the chemical aging, while contributing little to the overall crosslinking during PMC, has a significant effect on package warpage. The coupled chemical-thermo-mechanical model can be applied for performing numerical optimization for packaging process and assembly reliability.
Keywords
electronics packaging; finite element analysis; optimisation; reliability; Shadow Moire warpage analyses; assembly reliability; chemical aging induced shrinkage model; coupled chemical-thermomechanical modeling methodology; cure kinetics model; cure-dependent constitutive model; cure-dependent viscoelastic relaxation model; encapsulated electronic package; numerical finite element model; numerical optimization; polymerization conversion; post-mold curing process; Aging; Chemicals; Compounds; Electromagnetic compatibility; Numerical models; Polymers; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898774
Filename
5898774
Link To Document