• DocumentCode
    1733400
  • Title

    The Test Features of the Quad-Core AMD Opteron- Microprocessor

  • Author

    Wood, Tim ; Giles, Grady ; Kiszely, Chris ; Schuessler, Martin ; Toneva, Daniela ; Irby, Joel ; Mateja, Michael

  • Author_Institution
    Adv. Micro Devices, Austin, TX
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper describes the design-for-test (DFT) features of the quad-core AMD-OpteronTM microprocessor.
  • Keywords
    design for testability; integrated circuit testing; microprocessor chips; design-for-test features; microprocessor; quad-core AMD Opteron; Centralized control; Clocks; Decoding; Design for testability; Design methodology; Frequency; Master-slave; Microprocessors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700551
  • Filename
    4700551
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1733400