Title :
The Test Features of the Quad-Core AMD Opteron- Microprocessor
Author :
Wood, Tim ; Giles, Grady ; Kiszely, Chris ; Schuessler, Martin ; Toneva, Daniela ; Irby, Joel ; Mateja, Michael
Author_Institution :
Adv. Micro Devices, Austin, TX
Abstract :
This paper describes the design-for-test (DFT) features of the quad-core AMD-OpteronTM microprocessor.
Keywords :
design for testability; integrated circuit testing; microprocessor chips; design-for-test features; microprocessor; quad-core AMD Opteron; Centralized control; Clocks; Decoding; Design for testability; Design methodology; Frequency; Master-slave; Microprocessors; Testing; Voltage;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700551
