Title :
A heuristic DSP BIST insertion algorithm with minimum area overhead
Author :
Nassar, Doaa A. ; Salama, Aly E.
Author_Institution :
Mentor Graphics Egypt, Cairo, Egypt
fDate :
6/24/1905 12:00:00 AM
Abstract :
In this paper, a new methodology for generating a self-testable data path with minimum area overhead in a minimum number of test sessions is presented. The main contribution is in the register allocation and binding algorithm, which is constructed from two phases. In the first phase, a number of self-adjacent registers configured as concurrent built-in logic block observation registers (CBILBO´s) are minimized. As the registers configured as BILBO´s that can work as either pattern generator or signature analyzer for the same module add a large cost to the constructed data path, phase 2 of the proposed algorithm tries to minimize occurrence of those registers whenever possible in a minimum number of test sessions. When the algorithm is applied to DSP applications, an improvement is achieved for both area overhead and interconnections.
Keywords :
automatic test pattern generation; built-in self test; design for testability; digital signal processing chips; integrated circuit testing; logic testing; resource allocation; DFT; DSP applications; DSP chip testing; built-in logic block observation register; concurrent BILBO registers; heuristic DSP BIST insertion algorithm; minimum area overhead; pattern generator; register allocation/binding algorithm; self-adjacent registers; self-testable data path generation; signature analyzer; Automatic testing; Built-in self-test; Circuit testing; Costs; Digital signal processing; Digital signal processing chips; Electronic equipment testing; High level synthesis; Logic testing; Registers;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009908