Title :
Practical solutions for the application of the oscillation-based-test in analog integrated circuits
Author :
Vázquez, Diego ; Huertas, Gloria ; Leger, Gildas ; Rueda, Adoracón ; Huertas, José L.
Author_Institution :
Instituto de Microelectron. de Sevilla, Univ. de Sevilla, Spain
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper presents practical solutions for solving the problems arising when applying the oscillation-based-test to analog integrated circuits. It is devoted to discussing a practical on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.
Keywords :
analogue integrated circuits; built-in self test; circuit oscillations; counting circuits; integrated circuit testing; mixed analogue-digital integrated circuits; sigma-delta modulation; DC level measurement counter; amplitude measurement counter; analog ICs; analog integrated circuits; defect-driven test approach; digital counters; first-order ΣΔ modulator; frequency measurement counter; generated test signals; integrated prototype; on-chip evaluation circuitry; oscillation-based-test; sigma-delta modulator; Analog integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Distortion measurement; Filters; Frequency measurement; Oscillators; Prototypes; Signal generators;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1009909
