Low-voltage analog current detector supporting at-speed BIST

Author

Dragic, Srdjan ; Filanovsky, Igor ; Margala, Martin

Author_Institution

Electr. & Comput. Eng. Dept., Alberta Univ., Edmonton, Alta., Canada

Volume

1

fYear

2002

fDate

6/24/1905 12:00:00 AM

Abstract

This paper presents a design of a low-voltage analog current detector supporting the at-speed Built-In-Self-Test (BIST) methodology. In testing mode, the current detector performs a non-functional Iddq and delta Iddq test which enables a more accurate fail/pass decision. A 1.2 V high-frequency current amplifying cell is utilized. With a sensitivity of less than 200 nA, the detector achieves a wide gain-bandwidth product of 6.8 GHz and the low frequency current gain of 48 dB. The operation of the detector has been verified experimentally. The current detector has been implemented in 0.13 μm CMOS technology.

Keywords

CMOS integrated circuits; analogue integrated circuits; built-in self test; detector circuits; fault location; integrated circuit testing; leakage currents; mixed analogue-digital integrated circuits; wideband amplifiers; 0.13 micron; 1.2 V; 48 dB; CMOS technology; HF current amplifying cell; LV analog current detector; SoC test applications; analog cores; at-speed BIST methodology; built-in-self-test methodology; delta Iddq test; fail/pass decision; leakage currents; low-voltage current detector; mixed-signal cores; nonfunctional Iddq test; Analog computers; Built-in self-test; CMOS technology; Circuit testing; Detectors; Frequency; Integrated circuit testing; Logic arrays; Logic testing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on

Print_ISBN

0-7803-7448-7

Type

conf

DOI

10.1109/ISCAS.2002.1009910

Filename

1009910