Title :
Statistical acquisition for embedded instrumentation
Author :
De Souza, Adão A., Jr. ; Carro, Luigi
Author_Institution :
Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This work presents a methodology to acquire data from embedded sensors with a low impact on the analog area, suited to modern digital technologies. A parallel strategy is proposed where the basic blocks can use redundancy to cope with highly variable digital technologies. Statistics sampling with several uncorrelated noise references through one-bit comparators is used. Self configuration allows a robust process. Theoretical data and measurement results are shown, validating the proposed approach.
Keywords :
comparators (circuits); data acquisition; redundancy; sampling methods; signal reconstruction; signal sampling; data acquisition; digital signal processing; embedded instrumentation; embedded sensors; modern digital technologies; one-bit comparators; parallel strategy; redundancy; robust process; self configuration; statistical acquisition; statistics sampling; uncorrelated noise references; Circuits; Hardware; Instruments; Low-frequency noise; Noise robustness; Quantization; Signal processing; Signal resolution; Statistics; Stochastic resonance;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
Print_ISBN :
0-7803-8248-X
DOI :
10.1109/IMTC.2004.1351052
