Title :
External Loopback Testing Experiences with High Speed Serial Interfaces
Author :
Meixner, Anne ; Kakizawa, Akira ; Provost, Benoit ; Bedwani, Serge
Abstract :
Data eye margin test used in conjunction with loopback configuration has become a popular design for test (DFT) based test method for high speed links. This paper summarizes the DFT circuitry and test methods for supporting high speed serial interfaces (e.g. S-ATA,). The challenges of no-touch test methods in an external loopback environment are discussed. We close with a summary of our manufacturing experiences and directions for future improvement.
Keywords :
circuit testing; design for testability; DFT circuitry; data eye margin test; design for test; external loopback testing; high speed links; high speed serial interfaces; loopback configuration; no-touch test methods; Circuit testing; Clocks; Costs; Design for testability; Pulp manufacturing; Relays; Silicon; Test pattern generators; Timing; Voltage;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700557
