Title :
Low cost testing of multi-GBit device pins with ATE assisted loopback instrument
Author :
Fritzsche, William A. ; Haque, Asim E.
Author_Institution :
Credence Syst. Corp., Milpitas, CA
Abstract :
Loopback has always been a choice in testing multi-GBit device pins. It typically involves compromise in test coverage. This paper describes an instrument providing low-cost test capability for these pins which eliminates test compromises.
Keywords :
automatic testing; integrated circuit testing; ATE assisted loopback instrument; low-cost test capability; multi-GBit device pins; Built-in self-test; Circuit testing; Costs; Hardware; Instruments; Jitter; Pins; Power system modeling; Protocols; System testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700558
