Title :
A novel pulsed load-pull and S-parameter integrated measurement system
Author :
Teppati, Valeria ; Ferrero, Andrea ; Niculae, Valentin ; Pisani, Umberto
Author_Institution :
Dept. of Electron. Eng., Politecnico di Torino, Italy
Abstract :
In this paper, a new accurate pulsed load-pull and S-parameter integrated measurement bench is presented. Calibration techniques and verifications performed on the test-set are described. Finally, measurements on a medium power MESFET (10 × 100 μm) by Alenia Marconi Systems have been performed under pulsed and nonpulsed conditions, showing good agreement with expectations, thus further confirming the accuracy of the system.
Keywords :
S-parameters; calibration; measurement systems; microwave measurement; power MESFET; semiconductor device measurement; Alenia Marconi Systems; calibration techniques; integrated measurement system; nonpulsed conditions; power MESFET; pulsed S-parameter measurement; pulsed conditions; pulsed load-pull measurement; pulsed measurement calibration; Bandwidth; Dynamic range; Electromagnetic heating; Electrothermal effects; Filters; Power measurement; Power system modeling; Pulse measurements; Scattering parameters; Semiconductor device modeling;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
Print_ISBN :
0-7803-8248-X
DOI :
10.1109/IMTC.2004.1351060
