Title :
RTL Error Diagnosis Using a Word-Level SAT-Solver
Author :
Mirzaeian, Saeed ; Zheng, Feijun Frank ; Cheng, K. T Tim
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
Abstract :
We propose a novel methodology for design error diagnosis in the HDL description using a word-level solver. In this approach, the patterns that result in erroneous responses are first used to limit the number of initial error candidates. The RTL description of the design is then modified by adding one multiplexer to each of the possible error locations. For each of the erroneous pattern, the input pattern and the expected correct response are then imposed as constraints to the modified RTL model, resulting in a formula suitable for word-level satisfiability (SAT) solving. The solutions reported by the word-level SAT solver would indicate the potential error candidates. This constraint solving process iterates for each erroneous pattern, eventually resulting in a small set of error candidates. This method is sufficiently flexible to address both single-error and multiple-error diagnosis. We present experimental results for a set of public RTL benchmark designs to demonstrate the effectiveness of this proposed approach.
Keywords :
computability; error analysis; hardware description languages; multiplexing equipment; HDL description; RTL error diagnosis; erroneous pattern; error locations; multiple-error diagnosis; multiplexer; register transfer level; single-error diagnosis; word-level SAT-solver; word-level satisfiability; Circuit synthesis; Computer bugs; Computer errors; Design engineering; Design methodology; Error correction; Hardware design languages; Multiplexing; Signal design; Signal processing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700568