DocumentCode
1733882
Title
LSI packaging development for high-end CPU built into supercomputer
Author
Fujimori, Joji ; Koide, Masateru
Author_Institution
Fujitsu Semicond. Ltd., Tokyo, Japan
fYear
2011
Firstpage
2028
Lastpage
2032
Abstract
This paper reports on the development of CPU package for the next-generation supercomputer, besides a report of the assembly technology development of a large-scale BGA package that mounts large-scale chip. A large-scale LSI is mounted on CPU package developed this time. The size of a large-scale LSI is about 23.0×23.0mm. In addition, low permittivity (Low-k) material is adopted in interlayer dielectric in wiring layer. Because this Low-k material was fragile, being destroyed by stress that hangs in assembly became a problem. To clear this problem, the kind of the substrate was examined from the coefficient of thermal expansion. Moreover, the confirmation including an enough margin is done. The criterion was decided and the evaluation was executed. As a result, the Low-k layer was able to be prevented being destroyed. Next, it thought the control of void generated when under-fill was filled to be a critical. It is difficult because the chip size is large and there are a lot of numbers of solder bump. Best under-fill is selected an it was applied to this package. Finally, to accommodate to the demand value to severe thermal resistance, Cu-LID was selected as a high heat radiation structure. Additionally, the thermal interface material was adopted between the chip and Cu-LID. The amount of the warpage on the surface of Cu-LID was controlled to about 50 microns by this structure. Moreover, void of the metal joint was not generated, and either the wettability was satisfied. It passes the preprocessing and subsequent environmental test on JEDEC Level-4, and it thinks the package developed this time to be high-quality.
Keywords
ball grid arrays; large scale integration; solders; thermal expansion; LSI packaging development; assembly technology development; coefficient of thermal expansion; high-end CPU; large-scale BGA package; large-scale chip; next-generation supercomputer; solder bump; thermal interface material; Ceramics; Joints; Large scale integration; Metals; Reliability; Stress; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898795
Filename
5898795
Link To Document