Title :
Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications
Author :
Warwick, Thomas P. ; Rivera, Gustavo ; Waite, David ; Russell, James ; Smith, Jeffrey
Abstract :
Fine pitch SOC devices with multiple RF ports force specific board technologies, which increase repeatability issues for RF measurements. This paper analyzes some of the causes of measurement repeatability issues and suggests possible solutions.
Keywords :
system-on-chip; RF test; fine pitch SOC; high density SOC; load-board constraints; measurement repeatability; multiple RF ports force specific board; Circuit testing; Density measurement; Force measurement; Packaging; Production; Radio frequency; Semiconductor device measurement; Sockets; System-on-a-chip; Tuning;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700570
