• DocumentCode
    1734070
  • Title

    Tin-bismuth plating for component finishes

  • Author

    Zhang, Rui ; Zhang, Jiawei ; Evans, John ; Johnson, Wayne ; Vardaman, Jan ; Fujimura, Issei ; Tseng, Andy ; Knight, Jeff

  • fYear
    2011
  • Firstpage
    2060
  • Lastpage
    2066
  • Abstract
    With the transition to lead-free, the electronics industry has widely adopted matte Sn for use component surface finishes. However, it is well know that plated Sn finishes can result in Sn whisker formation. After significant work by numerous researchers, the exact mechanism for Sn whisker growth is still unknown. While industry standard test have been developed, there are no acceleration factors to correlate the laboratory test results to field life. Furthermore, testing (JESD22A121) of components with industry accepted mitigation strategies has still shown whisker growth in excess of allowable standards (JESD201A). The addition of bismuth, to Sn plating reduces whisker growth length. Sn whisker growth, solder wetting, backward compatibility and reliability are discussed.
  • Keywords
    bismuth alloys; electron device manufacture; reliability; soldering; surface finishing; tin alloys; wetting; whiskers (crystal); Sn-Bi; backward compatibility; component surface finishes; component testing; electronics industry; reliability; solder wetting; tin whisker formation; tin whisker growth; tin-bismuth plating; Bismuth; Lead; Nickel; Soldering; Surface finishing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898801
  • Filename
    5898801