DocumentCode :
1734070
Title :
Tin-bismuth plating for component finishes
Author :
Zhang, Rui ; Zhang, Jiawei ; Evans, John ; Johnson, Wayne ; Vardaman, Jan ; Fujimura, Issei ; Tseng, Andy ; Knight, Jeff
fYear :
2011
Firstpage :
2060
Lastpage :
2066
Abstract :
With the transition to lead-free, the electronics industry has widely adopted matte Sn for use component surface finishes. However, it is well know that plated Sn finishes can result in Sn whisker formation. After significant work by numerous researchers, the exact mechanism for Sn whisker growth is still unknown. While industry standard test have been developed, there are no acceleration factors to correlate the laboratory test results to field life. Furthermore, testing (JESD22A121) of components with industry accepted mitigation strategies has still shown whisker growth in excess of allowable standards (JESD201A). The addition of bismuth, to Sn plating reduces whisker growth length. Sn whisker growth, solder wetting, backward compatibility and reliability are discussed.
Keywords :
bismuth alloys; electron device manufacture; reliability; soldering; surface finishing; tin alloys; wetting; whiskers (crystal); Sn-Bi; backward compatibility; component surface finishes; component testing; electronics industry; reliability; solder wetting; tin whisker formation; tin whisker growth; tin-bismuth plating; Bismuth; Lead; Nickel; Soldering; Surface finishing; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898801
Filename :
5898801
Link To Document :
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