DocumentCode
1734070
Title
Tin-bismuth plating for component finishes
Author
Zhang, Rui ; Zhang, Jiawei ; Evans, John ; Johnson, Wayne ; Vardaman, Jan ; Fujimura, Issei ; Tseng, Andy ; Knight, Jeff
fYear
2011
Firstpage
2060
Lastpage
2066
Abstract
With the transition to lead-free, the electronics industry has widely adopted matte Sn for use component surface finishes. However, it is well know that plated Sn finishes can result in Sn whisker formation. After significant work by numerous researchers, the exact mechanism for Sn whisker growth is still unknown. While industry standard test have been developed, there are no acceleration factors to correlate the laboratory test results to field life. Furthermore, testing (JESD22A121) of components with industry accepted mitigation strategies has still shown whisker growth in excess of allowable standards (JESD201A). The addition of bismuth, to Sn plating reduces whisker growth length. Sn whisker growth, solder wetting, backward compatibility and reliability are discussed.
Keywords
bismuth alloys; electron device manufacture; reliability; soldering; surface finishing; tin alloys; wetting; whiskers (crystal); Sn-Bi; backward compatibility; component surface finishes; component testing; electronics industry; reliability; solder wetting; tin whisker formation; tin whisker growth; tin-bismuth plating; Bismuth; Lead; Nickel; Soldering; Surface finishing; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898801
Filename
5898801
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