Title :
Augmenting Boundary-Scan Tests for Enhanced Defect Coverage
Author :
Norrgard, Dayton ; Parker, Kenneth P.
Author_Institution :
Agilent Technol., Loveland, CO
Abstract :
Strict analyses of boundary-scan test coverage performed on real-world printed circuit board topologies reveal significant holes in test coverage. Rather than abandon boundary-scan, it is preferable to augment boundary-scan test with other technologies that improve the overall ability to detect defects.
Keywords :
boundary scan testing; network topology; printed circuit design; printed circuit testing; boundary-scan test coverage; enhanced defect coverage; printed circuit board topology; Circuit testing; Circuit topology; Connectors; Integrated circuit interconnections; Performance analysis; Performance evaluation; Pins; Printed circuits; Resistors; Wiring;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700580
