On-line Failure Detection in Memory Order Buffers

Technology scaling leads to burn-in phase out and higher post-silicon test complexity, which increases in-the-field error rate due to both latent defects and actual errors respectively. As a consequence, current reliability qualification methods will likely be infeasible. Microarchitecture knowledge of application runtime behavior offers a possibility to have low-cost continuous online testing techniques to cope with hard errors in the field. Whereas data can be protected with redundancy (like parity or ECC), there is a lack of mechanisms for control logic. This paper proposes a microarchitectural approach for validating that the memory order buffer logic works correctly.