Title :
A new approach to test and diagnose the faulty logic blocks in FPGAs
Author :
Elsayed, Amr ; Elbably, Mohamed ; Elbolok, Hatem
Author_Institution :
Fac. of Eng., Helwan Univ., Cairo, Egypt
Abstract :
The field programmable gate arrays (FPGAs) are widely used in the hardware implementation of many designed circuits. We introduce a new diagnosis procedure to detect the faulty nodes inside the FPGA and identify the faulty configurable logic blocks (CLBs) inside the faulty nodes. This procedure is based on Chwa-Hakimi model which provides the power to increase the capability of detection. A shifting technique is used to save the off-chip memory and to make the process of test and diagnosis is faster.
Keywords :
built-in self test; fault diagnosis; field programmable gate arrays; logic design; logic testing; Chwa-Hakimi model; FPGA; detection capability; faulty configurable logic blocks; field programmable gate arrays; hardware implementation; off-chip memory; shifting technique; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Field programmable gate arrays; Hardware; Logic functions; Logic testing; Programmable logic arrays;
Conference_Titel :
Radio Science Conference, 2003. NRSC 2003. Proceedings of the Twentieth National
Print_ISBN :
977-5031-75-3
DOI :
10.1109/NRSC.2003.1217361
