• DocumentCode
    1734281
  • Title

    The development of thin film barriers for encapsulating organic electronics

  • Author

    Kim, Yongjin ; Kim, Namsu ; Kim, Hyungchul ; Graham, Samuel

  • Author_Institution
    Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2011
  • Firstpage
    2101
  • Lastpage
    2106
  • Abstract
    In this work, we investigate several approaches to the development of encapsulation of organic electronics. A combination of plasma enhanced chemical vapor deposition, atomic layer deposition, and physical vapor deposition are used to make single layer and multilayer thin films and study the impact of structure on effective water vapor transmission rates. It was found that multilayer thin films consisting of organic and inorganic layers as well as inorganic nanolaminates provided the highest performance barrier films with effective water vapor transmission rates less than 5 × 10-5 g/m2/day. Materials such as atomic layer deposition deposited Al2O3 also showed excellent initial performance, but were found to be susceptible to corrosion from water. Combining alumina with other materials was found to improve the long-term performance of the alumina films. Integration of these films into organic solar cell platforms was shown to effectively maintain shelf lifetime performance for more than 7000 h.
  • Keywords
    aluminium compounds; atomic layer deposition; electronics packaging; encapsulation; laminates; plasma CVD; thin films; Al2O3; alumina films; atomic layer deposition; inorganic layers; inorganic nanolaminates; multilayer thin films; organic electronics encapsulation; physical vapor deposition; plasma enhanced chemical vapor deposition; single layer thin films; thin film barriers development; water vapor transmission; Aluminum oxide; Encapsulation; Films; Nonhomogeneous media; Performance evaluation; Photovoltaic cells; Polymers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898808
  • Filename
    5898808