Title :
Low Power Scan Shift and Capture in the EDT Environment
Author :
Czysz, D. ; Kassab, M. ; Lin, X. ; Mrugalski, G. ; Rajski, J. ; Tyszer, J.
Author_Institution :
Poznan Univ. of Technol., Poznan
Abstract :
This paper presents a new and comprehensive power-aware test scheme compatible with a test compression environment. The key contribution of the paper is a flexible test application framework that achieves significant reductions in switching activity during all phases of scan test: scan loading, unloading, and capture.
Keywords :
design for testability; electronic equipment testing; low-power electronics; network synthesis; EDT environment; flexible test application framework; low power scan shift; power-aware test; scan loading; scan test; scan unloading; test compression environment; Built-in self-test; Circuit testing; Energy consumption; Energy management; Flip-flops; Graphics; Logic testing; Power dissipation; Switching circuits; Voltage;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700585
