• DocumentCode
    1734520
  • Title

    Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained

  • Author

    Bastani, Pouria ; Callegari, Nick ; Wang, Li.-C. ; Abadir, Magdy S.

  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    For sub-65 nm design, there can be many timing effects not explicitly and/or accurately modeled and simulated. For design-silicon timing convergence, this paper describes a novel path-based diagnosis approach that analyzes and ranks potential design related issues causing the unexpected timing effects. We explain in detail how a path can be encoded with a set of diverse "features" based on one\´s knowledge of the potential issues. We explain how these features can be interpreted differently in a data learning algorithm based on adjusting a so-called kernel function. Then, we explain how kernel-based data learning can be used to rank the importance of features such that a feature contributing the most to design-silicon timing mismatch is ranked the highest. We conclude the paper by showing an application result on an industrial ASIC design.
  • Keywords
    application specific integrated circuits; elemental semiconductors; integrated circuit design; silicon; Si; data learning algorithm; design-silicon timing mismatch diagnosis; encoding; industrial ASIC design; kernel function; path-based diagnosis approach; size 65 nm; Application specific integrated circuits; Delay; Encoding; Engines; Kernel; Predictive models; Silicon; Support vector machine classification; Support vector machines; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700588
  • Filename
    4700588