DocumentCode :
1734646
Title :
Extraction of Effective Carrier Velocity in RF MOSFETs
Author :
Yun, Yeonam ; Kang, In Man ; Park, Byung-Gook ; Lee, Jong Duk ; Shin, Hyungcheol
Author_Institution :
Sch. of EE, Seoul Nat. Univ.
fYear :
2007
Firstpage :
72
Lastpage :
75
Abstract :
A more accurate method based on the actual inversion charge measurement in this paper is proposed to extract the effective carrier velocity in RF MOSFETs. This method uses the gate-drain intrinsic capacitance and gmb-gm relation to get the actual inversion charge at various Vds, and above parameters are obtained from S-parameters. This method gives more accurate result over the whole range of Vds, because it doesn´t assume a linear approximation to obtain the inversion charge and it doesn´t limit the range of applicable Vds
Keywords :
MOSFET; charge measurement; RF MOSFET; S-parameters; charge measurement; effective carrier velocity; gate-drain intrinsic capacitance; Capacitance; Charge measurement; Cutoff frequency; Equations; Equivalent circuits; Intrusion detection; Linear approximation; MOSFETs; Radio frequency; Scattering parameters; Carrier velocity; MOSFET; S-parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on
Conference_Location :
Long Beach, CA
Print_ISBN :
0-7803-9764-9
Electronic_ISBN :
0-7803-9765-7
Type :
conf
DOI :
10.1109/SMIC.2007.322772
Filename :
4117328
Link To Document :
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