DocumentCode :
1734699
Title :
Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs
Author :
Ko, Ho Fai ; Kinsman, Adam B. ; Nicolici, Nicola
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON
fYear :
2008
Firstpage :
1
Lastpage :
10
Abstract :
Post-silicon validation is used to identify design errors in silicon. Its main limitation is real-time observability of the circuit´s internal nodes. In this paper, we introduce a novel design-for-debug architecture which automatically allocates distributed trace buffers to handle debug data acquisition requests from multiple sources located in different cores. Using resource-efficient and intelligent control placed on-chip, we show how real-time observability can be improved, thus helping bridge the gap between pre-silicon verification and post-silicon validation for SOC designs.
Keywords :
integrated circuit design; integrated circuit testing; logic design; monolithic integrated circuits; system-on-chip; debug data acquisition; design error identification; design-for-debug architecture; distributed embedded logic analysis; distributed trace buffer allocation; intelligent control placed on-chip; post-silicon validation; presilicon verification; real-time observability; system-on-chip design; Circuits; Computer bugs; Costs; Data acquisition; Design for disassembly; Logic design; Observability; Silicon; System-on-a-chip; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
Type :
conf
DOI :
10.1109/TEST.2008.4700594
Filename :
4700594
Link To Document :
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