• DocumentCode
    1734756
  • Title

    Ground-Semiconductor-Ground Guiding Phenomena of Noise Coupling in CMOS Substrate

  • Author

    Wu, Hsien-Hung ; Tzuang, Ching-Kuang C.

  • Author_Institution
    SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu
  • fYear
    2007
  • Firstpage
    83
  • Lastpage
    86
  • Abstract
    Ground-semiconductor-ground (GSG) transmission line (TL) is proposed and investigated thoroughly for the assessment of CMOS signal integrity problem at multi-GHz frequency regime. The GSG TL models the practical implementation of CMOS logic layout, which consists of power line, Nwell line (semiconductor), Pwell line (semiconductor), and ground line. Rigorous field-theory analyses and experiments show that GSG TL supports the CPW (coplanar waveguide) mode for the particular case study, which also demonstrate the slow-wave factor can be as high as 50 at 1 GHz and decrease to 10 at 10 GHz, pointing to the fact that the slow-wave phenomena will be more pronounced for CMOS electronics operated beyond tens of GHz
  • Keywords
    CMOS integrated circuits; CMOS logic circuits; transmission lines; CMOS logic layout; CMOS signal integrity; CMOS substrate; Nwell line; Pwell line; coplanar waveguide; ground line; ground-semiconductor-ground guiding phenomena; ground-semiconductor-ground transmission line; noise coupling; power line; slow-wave factor; CMOS logic circuits; Coplanar waveguides; Couplings; Frequency; Power transmission lines; Semiconductor device modeling; Semiconductor device noise; Semiconductor waveguides; Substrates; Waveguide components; CMOS; guiding phenomena; signal integrity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on
  • Conference_Location
    Long Beach, CA
  • Print_ISBN
    0-7803-9764-9
  • Electronic_ISBN
    0-7803-9765-7
  • Type

    conf

  • DOI
    10.1109/SMIC.2007.322775
  • Filename
    4117331