DocumentCode :
1734760
Title :
A time-domain 1D Kirchhoff-PIC code for coupled-cavity traveling wave tubes
Author :
Qiu, W.D. ; Lee, H.J. ; Verboncoeur, J.P. ; Birdsall, C.K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
2001
Firstpage :
279
Abstract :
Summary form only given, as follows. We developed a 1-d small/large signal Kirchhoff-PIC hybrid code for modeling coupled-cavity traveling-wave tube (CCTWT). The objective is to determine the interaction between the electron beam and cavities both in the linear and nonlinear regimes. A, small signal multi-frequency TWT code can provide a description of the power spectrum produced by a low frequency modulated beam. A large signal multi-frequency TWT code is required to study the nonlinear mechanism responsible for mixing the low frequency modulation with the high frequency carrier signal. Each cavity is modeled as a three-port equivalent Curnow circuit with R, L, C elements. The input/output ports of each Curnow element connects to the corresponding output/input port of the following element, while the third port, called the beam port, models the interaction between the cavity gaps and the beam. The voltage across the beam port and the current through it are solved self-consistently, and the beam space charge forces for all discrete modes are included via the standard PIC method.
Keywords :
travelling wave tubes; beam space charge; cavity gaps; coupled-cavity traveling wave tubes; electron beam; high frequency carrier signal; linear regimes; low frequency modulated beam; low frequency modulation; nonlinear mechanism; nonlinear regimes; power spectrum; small signal multi-frequency TWT code; three-port equivalent Curnow circuit; time-domain 1D Kirchhoff-PIC code; Cathodes; Circuits; Electron beams; Frequency modulation; Modulation coding; Optical modulation; Power amplifiers; Space charge; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.960925
Filename :
960925
Link To Document :
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