Title :
Crosstalk in VLSI partially coupled interconnect structures, a comprehensive evaluation
Author :
Fattah, Golnaz ; Masoumi, Nasser
Author_Institution :
Fac. of Electr. & Comput. Eng., Kerman Grad. Univ. of Technol., Kerman, Iran
Abstract :
In this paper, the investigation methodology for crosstalk evaluation in two groups of interconnect structures in nano scale VLSI circuits is presented. The first group consists of a victim line shorter than the aggressor line. We show that when the interconnects parameters are chosen properly, and the victim line stays at the end part of the aggressor line, the crosstalk noise can be reduced up to 86% in comparison to the case that the victim line is placed at the beginning of the other line. The interconnects in the second group are identical and partially coupled. The results obtained from an extensive study show that by choosing optimum values, the crosstalk noise can be reduced up to 92% when the victim line stays ahead of the aggressor line, in comparison to the case that it is placed behind it.
Keywords :
VLSI; crosstalk; integrated circuit interconnections; VLSI circuits; aggressor line; comprehensive evaluation; crosstalk; partially coupled interconnect structures; victim line; Capacitance; Couplings; Crosstalk; Driver circuits; Integrated circuit interconnections; Very large scale integration; Wires; Crosstalk; aggressor line; interconnect; victim line;
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
Conference_Location :
Naples
Print_ISBN :
978-1-4577-0466-6
Electronic_ISBN :
978-1-4577-0465-9
DOI :
10.1109/SPI.2011.5898831