DocumentCode
1734896
Title
Electrical performance of a multiport interposer for measurements of dense via arrays
Author
Kotzev, Miroslav ; Kwark, Young H. ; Baks, Christian ; Gu, Xiaoxiong ; Schuster, Christian
Author_Institution
Tech. Univ. Hamburg-Harburg (TUHH), Germany
fYear
2011
Firstpage
43
Lastpage
46
Abstract
In this paper the bandwidth limitations of two types of multiport probing fixtures for measurements of high density via array structures are investigated. Using a two-tier calibration technique and custom-made calibration substrates, error parameters for the probing fixtures were extracted and used to evaluate variability in measurements and substrate correction parameters. Results show adequate repeatability of the obtained error parameters up to 20 GHz. Digital links were measured utilizing these probing fixtures and results were compared to S-parameter measurements using RF microprobes. Good correlation up to 10 GHz - 15 GHz was established when compared to microprobe based measurements of link structures with stub access vias. For link structures with through access vias the adequate correlation bandwidth was founded to be 5 GHz - 10 GHz.
Keywords
integrated circuit interconnections; RF microprobes; S-parameter measurements; bandwidth limitation; custom-made calibration substrates; dense via arrays; electrical performance; error parameters; high density via array structures; multiport interposer; multiport probing fixtures; substrate correction parameters; two-tier calibration; Calibration; Connectors; Correlation; Fixtures; Probes; Reflection; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
Conference_Location
Naples
Print_ISBN
978-1-4577-0466-6
Electronic_ISBN
978-1-4577-0465-9
Type
conf
DOI
10.1109/SPI.2011.5898837
Filename
5898837
Link To Document