• DocumentCode
    1734896
  • Title

    Electrical performance of a multiport interposer for measurements of dense via arrays

  • Author

    Kotzev, Miroslav ; Kwark, Young H. ; Baks, Christian ; Gu, Xiaoxiong ; Schuster, Christian

  • Author_Institution
    Tech. Univ. Hamburg-Harburg (TUHH), Germany
  • fYear
    2011
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    In this paper the bandwidth limitations of two types of multiport probing fixtures for measurements of high density via array structures are investigated. Using a two-tier calibration technique and custom-made calibration substrates, error parameters for the probing fixtures were extracted and used to evaluate variability in measurements and substrate correction parameters. Results show adequate repeatability of the obtained error parameters up to 20 GHz. Digital links were measured utilizing these probing fixtures and results were compared to S-parameter measurements using RF microprobes. Good correlation up to 10 GHz - 15 GHz was established when compared to microprobe based measurements of link structures with stub access vias. For link structures with through access vias the adequate correlation bandwidth was founded to be 5 GHz - 10 GHz.
  • Keywords
    integrated circuit interconnections; RF microprobes; S-parameter measurements; bandwidth limitation; custom-made calibration substrates; dense via arrays; electrical performance; error parameters; high density via array structures; multiport interposer; multiport probing fixtures; substrate correction parameters; two-tier calibration; Calibration; Connectors; Correlation; Fixtures; Probes; Reflection; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
  • Conference_Location
    Naples
  • Print_ISBN
    978-1-4577-0466-6
  • Electronic_ISBN
    978-1-4577-0465-9
  • Type

    conf

  • DOI
    10.1109/SPI.2011.5898837
  • Filename
    5898837