DocumentCode :
1734896
Title :
Electrical performance of a multiport interposer for measurements of dense via arrays
Author :
Kotzev, Miroslav ; Kwark, Young H. ; Baks, Christian ; Gu, Xiaoxiong ; Schuster, Christian
Author_Institution :
Tech. Univ. Hamburg-Harburg (TUHH), Germany
fYear :
2011
Firstpage :
43
Lastpage :
46
Abstract :
In this paper the bandwidth limitations of two types of multiport probing fixtures for measurements of high density via array structures are investigated. Using a two-tier calibration technique and custom-made calibration substrates, error parameters for the probing fixtures were extracted and used to evaluate variability in measurements and substrate correction parameters. Results show adequate repeatability of the obtained error parameters up to 20 GHz. Digital links were measured utilizing these probing fixtures and results were compared to S-parameter measurements using RF microprobes. Good correlation up to 10 GHz - 15 GHz was established when compared to microprobe based measurements of link structures with stub access vias. For link structures with through access vias the adequate correlation bandwidth was founded to be 5 GHz - 10 GHz.
Keywords :
integrated circuit interconnections; RF microprobes; S-parameter measurements; bandwidth limitation; custom-made calibration substrates; dense via arrays; electrical performance; error parameters; high density via array structures; multiport interposer; multiport probing fixtures; substrate correction parameters; two-tier calibration; Calibration; Connectors; Correlation; Fixtures; Probes; Reflection; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects (SPI), 2011 15th IEEE Workshop on
Conference_Location :
Naples
Print_ISBN :
978-1-4577-0466-6
Electronic_ISBN :
978-1-4577-0465-9
Type :
conf
DOI :
10.1109/SPI.2011.5898837
Filename :
5898837
Link To Document :
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