• DocumentCode
    1734949
  • Title

    Modeling Test Escape Rate as a Function of Multiple Coverages

  • Author

    Butler, Kenneth M. ; Carulli, John M., Jr. ; Saxena, Jayashree

  • Author_Institution
    Texas Instrum., Dallas, TX
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The Williams and Brown model has long been the gold standard for estimating test escape rate as a function of yield and fault coverage. However, today´s test programs have a number of differing test types, often with overlapping failing unit detections. This paper details the development of a method which permits test escape rate predictions based on product yield and multiple overlapping test coverages.
  • Keywords
    design for testability; fault diagnosis; integrated circuit modelling; integrated circuit testing; integrated circuit yield; Williams and Brown model; design for test; fault coverage; integrated circuit; multiple overlapping test coverages; product yield; test escape rate modeling; test escape rate prediction; test program; Automatic testing; Circuit testing; Design engineering; Design for testability; Integrated circuit testing; Life testing; Production; Software testing; Virtual manufacturing; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700605
  • Filename
    4700605
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1734949