DocumentCode
1735048
Title
Bridging the gap between Design and Test Engineering for Functional Pattern Development
Author
Aderholz, Ernst ; Ahrens, Heiko ; Rohleder, Michael
Author_Institution
Freescale Semicond., Munich
fYear
2008
Firstpage
1
Lastpage
10
Abstract
Historically, functional patterns supplementing structural test methods were derived from simulation data with little communication between design and test/product engineering. These teams are often located in different areas, time zones and working environments. Experience shows, that the functional tester pattern generation process is very tedious, time consuming and error-prone, and involves extensive manual pattern modification. The automation of this process is dedicated to improve this situation with introducing a newly developed `Tester API´. This API enables a highly flexible, and extensible flow for injecting test specific information into a tester pattern. It provides enough information to support simplified initial pattern debug on the ATE and results in final tester pattern generated without any hand modifications. Designed for reusability on product derivatives and retargetability to different ATE platforms the `Tester API´ is introduced to bridge the knowledge transfer gap between the verification team creating tester patterns and the team implementing the test execution on the actual tester hardware.
Keywords
automatic test pattern generation; design for testability; design engineering; functional pattern development; structural test methods; test engineering; Aerospace testing; Automation; Automotive engineering; Circuit testing; Data engineering; Design engineering; Electronic equipment testing; Qualifications; Semiconductor device testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
978-1-4244-2402-3
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2008.4700609
Filename
4700609
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