• DocumentCode
    1735048
  • Title

    Bridging the gap between Design and Test Engineering for Functional Pattern Development

  • Author

    Aderholz, Ernst ; Ahrens, Heiko ; Rohleder, Michael

  • Author_Institution
    Freescale Semicond., Munich
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Historically, functional patterns supplementing structural test methods were derived from simulation data with little communication between design and test/product engineering. These teams are often located in different areas, time zones and working environments. Experience shows, that the functional tester pattern generation process is very tedious, time consuming and error-prone, and involves extensive manual pattern modification. The automation of this process is dedicated to improve this situation with introducing a newly developed `Tester API´. This API enables a highly flexible, and extensible flow for injecting test specific information into a tester pattern. It provides enough information to support simplified initial pattern debug on the ATE and results in final tester pattern generated without any hand modifications. Designed for reusability on product derivatives and retargetability to different ATE platforms the `Tester API´ is introduced to bridge the knowledge transfer gap between the verification team creating tester patterns and the team implementing the test execution on the actual tester hardware.
  • Keywords
    automatic test pattern generation; design for testability; design engineering; functional pattern development; structural test methods; test engineering; Aerospace testing; Automation; Automotive engineering; Circuit testing; Data engineering; Design engineering; Electronic equipment testing; Qualifications; Semiconductor device testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2008. ITC 2008. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-2402-3
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2008.4700609
  • Filename
    4700609