DocumentCode
1735130
Title
The effect of interference power and bandwidth on space-time adaptive processing
Author
Moore, T.D. ; Gupta, I.J.
Author_Institution
Veridian Syst. Div., Ann Arbor, MI, USA
Volume
1
fYear
2003
Firstpage
53
Abstract
In STAP, an N-length digital filter or tapped-delay line with adjustable weights is placed behind each antenna element. With L antenna elements and N taps per element, the STAP-equipped array has LN-1 degrees of freedom available. Theoretically, up to LN-1 independent. radio frequency interference (RFI) sources can be nulled, providing a significant advantage over a conventional adaptive array which is limited to L-1 spatial degrees of freedom. However, this is only obtained for RFI with 0% bandwidth. Wideband interference is known to limit adaptive array performance. The degrees of freedom consumed in STAP are shown to be strongly dependent on the interference power and bandwidth. We demonstrate that a strong direct path wideband RFI can consume more than "N" degrees of freedom in a multi-tap STAP wherein "wideband" is defined as a bandwidth equal to the sample rate or inverse tap delay of the STAP processor. Thus, the effect of a strong wideband RFI direct-path source on STAP performance can be similar to that of a dispersive multipath environment.
Keywords
adaptive antenna arrays; antenna radiation patterns; array signal processing; delays; radiofrequency interference; space-time adaptive processing; RFI sources; STAP; adaptive antenna array; antenna pattern; digital filter; dispersive multipath environment; interference bandwidth; interference power; inverse tap delay; radio frequency interference sources; sample rate; space-time adaptive processing; tapped-delay line; wideband interference; Adaptive arrays; Antenna arrays; Bandwidth; Broadband antennas; Delay lines; Dispersion; Eigenvalues and eigenfunctions; Narrowband; Radiofrequency interference; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location
Columbus, OH, USA
Print_ISBN
0-7803-7846-6
Type
conf
DOI
10.1109/APS.2003.1217399
Filename
1217399
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